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ADX2700 X-ray Diffraction Instrument

USA

ADX2700

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1 Unit

Insulated wooden crate

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الوصف

Introduction

ADX2700 θθ Powder Xray Diffraction Instrument is multifunction diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX2700 is a diffraction instrument designed for the challenges of modern materials research. ADX2700 can analyze powders, liquids, thin films, nanomaterials and many other different materials. The ADX2700 can be used for many different applications: Academic, Pharmaceuticals, Chemical & Petrochemical, Material Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.

Features

 

 

 

Computed tomography, Highresolution Xray diffraction, High throughput screening, Inplane diffraction, Crystallite size and microstrain analysis, Microdiffraction, Nonambient diffraction, Pair distribution function analysis, Phase identification, Phase quantification, Reflectivity analysis, Residual stress analysis,
Crystallography, Texture analysis, Transmission, Thin film analysis.

ADXDWZ Combination of Eulerian cradle for stress and texture investigations, Thin film and Quantity Analysis attachment with control and analysis software with alignmentfree feature.  

ADCX sample changer is compact and rugged. Integrated spinning improves particle statistics in polycrystalline sample measurements. Fully automatic alignment. Programmable

 

Accessories

 

 

 

 

 

AHTK 1000 high temperature attachment 
Automated variable temperature stage for Xray diffraction measurements of materials at elevated temperatures (room temperature1200°C). The stage may be operated in vacuum. The sample is heated radiantly for reduced heat gradients within the sample. Automated z translation within the stage assures precise sample positioning even in the presence of thermal expansion of the sample. 
  

 

 ALTK450 Variable temperature attachment 
Automated variable temperature stage for Xray diffraction measurements of crystal structure (193°C450°C). The stage can be operated under liquid nitrogen cooling conditions..

 

                            

Software

General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1,α2, background remove, pattern smoothing and magnifying, mulriple plot, threedimensional plot and simulation of XRD pattern.

  • Qualitative Analysis: The data processing software has the search and match function on the base of whole profile and diffraction angle. The whole profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error.
  • Quantitative Analysis: After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion)
  • Plot and Export: The data processing software is operated within the Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.
  • Phase identification, structure analysis, Thin film analysis, stress investigation, Texture analysis are all available
Parts and Specifications
Xray Generator Control mode 1kV/step, 1mA/step controlled by PC
Rated output power 4 kW
Tube voltage 1060 kV 1kV continuously adjustable
Tube current 580 mA continuously adjustable
Xray tube Cu, Fe, Co, Cr, Mo et al (2 kW)
Focus dimension: 1×10 mm2 or 0.4×10 mm2
Stability ≤ 0.0005%  mains fluctuation
Goniometer Goniometer theta(θ)/theta(θ)
Diffraction circle semidiameter 285mm
Scan range of θ 3° to +160°
Continuous scanning speed 0.00696°/min
Setting speed of angle 1500°/min
Scan mode θθ or θ, θ; Continuous or step scanning
One way repeatability of θ ≤ 0.0002°
precision of θd or θs ≤0.005°
Minimal stepping angle 0.0001°
   
   

Record Unit

 

Counter PC or SC
Maximal CPS

5x10^6 CPS

Proportion counter energy spectrum resolution ≤ 25%(PC), ≤ 50%(SC)
Detectable high voltage 15002100 continuous tune
High voltage of  the counter  differential or integral, automatic PHA, dead time emendation
ADXDWZ System detector stability ≤ 0.01%
Micro Structure Micro Structure analysis, +/0.5nm
MicroDiffraction Micro sample or area, 2nm19 um
Integrated performance Dispersion dosage ≤ 1μSv/h
Integrated stability of the system ≤ 0.5%
Dimension 1000 × 800 × 1640 mm

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الشخص الذي يمكن الاتصال به:Mr. Angstrom

الشركة:Angstrom Advanced

عنوان:95 Mill Street, Stoughton, Massachusetts, USA,02072

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Mr. Angstrom < Angstrom Advanced >
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