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Frequency Test Probe Pogo Pin SCPC**8 Series for Integrated Circuit Inspection

Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

 

SCPC**8 series is a medium-sized one in all semiconductor test probes. Both plungers are movable. There is a concave ring at one end of the barrel. It can be applied to the tests of products which requires relatively high accuracy, for example frequency tests of semiconductor and communication devices.  Developed and manufactured on our own, this product takes the lead in the test industry. Our complete production lines can also meet the needs for mass production. 

 

Its parameters are as below.

Materials (plated)

Barrel:    Phosphor Bronze, Au on Ni Plated

Bottom Plunger:   Beryllium Copper, Au on Ni Plated

Top Plunger:  Beryllium Copper, Au on Ni Plated

Spring:   SWP-A/B, Au on Ni Plated

 

Electronic Specification:

Current Rating:     4 amps

Contact Resistance:      *0 milliohms max

Bandwidth:    9.3 *@********************ation Delay:      *7 ps

Inductance:   1MHZ