IEC61032 Test Probe B, Test Finger Probe

IP1X: *0mm Sphere test probe with hande

IP2X: Jointed finger Test pobe

IP3X: 2.5mm Test rod

IP4X: 1.0mm test wire

IEC****9 IP2X Hinged Test Finger Probe
This Hinged Test Finger Probe is a precision test probe made according to IEC****9 and is used to simulate a human finger to verify the basic protection against access to hazardous parts. It's also used to verify the protection against access with a finger.
The Articulated Finger Probe is also on the IEC****5, IRAM*****1, IEC****8, IEC****9 etc. It's presented in most of the rules involved in the verification of accessibility to parts.

Technical Parameters:

Kunrled finger diameter *2mm                                    
Knurled Finger length *0mm
Baffle plate diameter *0mm
Baffle plate length **0mm
Baffle thickness *0mm