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~Description:

EXF***0 can provide customers higher accuracy and precision.

EXF ***0 with Si-pin detector delivers wide elemental coverage with an easy-to-learn software. Non-destructively analyze from sodium (Na) through uranium (U) in powders, liquids and solids.

It is designed exactly to security standards with active radiation protection, high voltage protection and X-ray tube overheating protection.

Malfunction Analyze.

Low cost with unmatched performance-to-price ratio.

Competitive Advantage:

1.Come with the latest Si Pin Diode Detectors/ Silicon Drift Detectors that allow for highest accuracy

2.Inbuilt printer to print reports. Option to print images with external printer

3.Hi resolution camera with zooming capability

4. Ergonomic design with convenient placement of chamber

5.Reports in multiple formats - PDF or  Excel

6.Can securely store all analysis data on the cloud to be accessed anywhere

7.Detects a wide range of elements from Na to U

8. Stable software system, Warm-up and anti-interference procedure is controlled by the program, to reduce the interference by the reflected X-ray and the spectrums, to improve the accuracy and stability.

Specifications:

Working Principle: Energy Dispersive X-ray Fluorescence

Size(mm): **0***0***0

Detection limit: **0ppm Best substance effect

Precision: ±*0ppm~0.1%

Expanded Uncertainty: ≤0.*9%

Operating Environment: Temperature **1~*6ºC

Humidity ≤*0%

High Voltage: 0~*0KV/0~1MA

Detector: Si-Pin**5Kev±5

Testable Elements: Any *0 Elements from whole elements (Na~U)

Main Structure: High-strength metal frame and industry plastic shell

N/G Weight(KG): *3 / *7

Applications:

Fast, precise and non-destructive metal testing for jewelry retailers, jewelry manufacturers, precious metal refineries, pawn shops, government quality inspection departments, banks, laboratories and tertiary institutions.